全视场外差白光干涉测量技术

Full-field heterodyne white light interferometry

为了解决传统白光干涉测量技术中对线性位移机构的位移精度要求过高的问题,本文提出了一种全视场外差白光干涉测量技术。该技术主要通过使用存在差频的白光干涉信号作为光源来实现在大扫描步长和低扫描精度条件下相干峰位置的高精度检测。本文首先建立了白光外差干涉的数学模型,再根据数学模型提供的光强信号特性提出了整体系统设计方案,然后对测量方案的可行性进行了实验验证。最后针对多种误差对算法计算精度的影响进行了理论分析和数据对比。误差分析的结果表明:白光外差干涉测量技术提供更高的测量精度和更好的抗干扰性能,有效地降低了传统白光干涉测量对线性位移机构精度的严苛依赖,为光学自由曲面检测技术提供了更多的可选解决方案。

In order to solve the problem that the displacement accuracy of linear displacement mechanism is too high in traditional white light interferometry, this paper proposes a full-field heterodyne white light interferometry. The technology mainly uses the white light interference signal with difference frequency as the light source to realize the high-precision detection of the coherent peak position under the conditions of large push step and low push precision. In this paper, the mathematical model of white light heterodyne interference is established firstly, and then the overall system design scheme is proposed according to the light intensity signal characteristics provided by the mathematical model. Then the feasibility of the measurement scheme is verified by experiments. At the end, theoretical analysis and data comparison are carried out for the influence of various errors on the calculation accuracy of the algorithm. The results of error analysis show that the white-light heterodyne interferometry technology provides higher measurement accuracy and better anti-interference performance, effectively reducing the strict dependence of traditional white light interferometry on the accuracy of linear displacement mechanism, and is an optical free-form surface detection technology. More solutions are available.