基于自动测试系统实现系统级芯片异步信号测试

Asynchronous Signal Test of System on Chip Based on Auto-Test Equipment

大部分的系统级芯片(SoC)具有异步信号,基于自动测试系统(ATE)很难实现稳定的测试。通过外挂Flash芯片对被测SoC器件进行功能配置,自动测试系统对相应的功能进行搜索匹配,可以在自动测试系统上对SoC的异步输出信号进行稳定的测试。

Most of system on chip(SoC)chips have asynchronous signals,it’s difficult to obtain stable testing with auto-test equipment(ATE).This paper introduces the plan of configuring the functions of SoC with a FLASH chip,then finishing testing the corresponding functions with the scan-match methods of ATE,which can achieve stable testing of asynchronous signals of the SoC chip with ATE.