片式电阻防硫化可靠性技术研究

Study on Reliability of Chip Resistor in Preventing Sulfuration

针对某模块产品中片式电阻出现硫化失效问题,通过对片式电阻硫化的机理研究,结合高可靠非封闭结构产品及使用环境要求,开展了多种质量等级电阻、工艺方案、工艺材料的耐硫化环境试验。通过多组试验的对比,提出了非封闭结构产品中片式电阻防硫化的可靠性技术解决方案。

For problem of sulfuration failure of chip resistor in a module product,the mechanism of chip resistor sulfuration was studied,combined with high reliability and non-enclosed structure products and operating environment requirements,the sulfuration experiments of various quality levels,process schemes and process materials were carried out.Through the comparison of several experiments,the reliability technical solution of anti-sulfuration of chip resistance in non-closed structure products is proposed.