摘要
在电子产品双边定数截尾寿命试验下,当寿命分布为Weibull分布时,探讨了两参数的联合置信区间估计的一种方法,并通过Monte Carlo模拟实验证明了此方法的可行性。
Under the double Type-IIcensored sample life test of electronic products,when the life distruction is Weibull distribution,a method for joint confidence interval estimation of two parameters is discussed,and the feasibility of this method is proved by the Monte Carlo simulation.
作者
田霆
TIAN Ting(School of Mathematical Sciences,Huaqiao University,Quanzhou 362021,China)
出处
《电子产品可靠性与环境试验》
2020年第1期40-42,共3页
Electronic Product Reliability and Environmental Testing
关键词
威布尔分布
双边定数截尾
联合置信区间
蒙特卡罗模拟
Weibull distribution
double type-II censored sample
joint confidence interval
Monte Carlo simulation
