一种优化芯片测试时间的方法

A Method of Optimizing Chip Testing Time

为了减少芯片测试时间,降低芯片测试成本,介绍一种基于智能卡芯片的测试时间优化的方法。通过分析大生产的测试数据,对测试流程、测试程序以及测试向量进行优化,在保证质量的前提下,对测试项进行优化,提高测试效率,测试时间减少19.623%,从而有效降低成本,提高生产能力。

In order to reduce test time and test cost,this paper introduces a test time optimization method based on smart card chip.By analyzing the test data of mass production,the test process,test procedure and test vector are optimized.On the premise of ensuring the quality,the test items are optimized to improve the test efficiency and reduce the test time by 19.623%,so as to effectively reduce the cost and improve the production capacity.