期刊文献+

轨道交通用IGBT器件寿命预测技术综述 被引量:7

IGBT Module Lifetime Prediction Technology for Rail Transit
下载PDF
导出
摘要 随着中国轨道交通车辆陆续进入高级修阶段,IGBT器件寿命预测技术成为行业关注的热点,科学的寿命评估方法是实现IGBT变流器全生命周期管理的基础。文章针对轨道交通的应用,介绍了IGBT器件失效机理、寿命预测模型及计算流程;通过概述国内外相关研究现状,归纳了目前IGBT器件寿命预测面临的难题,分析了通过采用智能化驱动、大数据分析及人工智能、状态检测等技术来提高IGBT器件寿命预测的准确性。 Rail transport IGBT module lifetime prediction technology has become research focuses due to China’s rail transit vehicles entering the stage of overhaul,thus scientific module lifetime prediction method is the key to realize the IGBT converter life cycle management.Based on rail transit applications,the failure mechanism,lifetime prediction model and process of IGBT module were introduced,and the challenges by collect relevant research results both at home and abroad were summarized,then it was proposed that IGBT intelligent drive,big data analysis and artificial intelligence,condition monitor and other technologies could improve the accuracy of IGBT module lifetime prediction.
作者 王彬 曹琳 WANG Bin;CAO Lin(Research Institute,CRRC Yongji Electric Co.,Ltd.,Yongji,Shanxi 044502,China)
出处 《机车电传动》 北大核心 2020年第1期9-12,共4页 Electric Drive for Locomotives
基金 国家重点研发计划项目(2017YFB1200902,2018YFB1201802-3)。
关键词 轨道交通 IGBT器件 寿命预测 仿真 railway transit IGBT module lifetime prediction simulation
  • 相关文献

参考文献10

二级参考文献104

  • 1王立乔,黄玉水,刘兆焱木,张仲超.多电平变流器多载波PWM技术的研究[J].浙江大学学报(工学版),2005,39(7):1025-1030. 被引量:29
  • 2陈星弼.场限环的简单理论.电子学报,1988,:6-9.
  • 3唐勇.大容量特种高性能电力电子系统中器件模型理论研究[D].武汉:海军工程大学电气工程学院,2010.
  • 4H-G Eckel, et al. A new Family of Modular IGBT Converters for Traction Applications[ J . EPE, 2005: 1-10.
  • 5Mark M Bakran, et al. Next Generation of IGBT-Modules Ap- plied to High Power Traction J . power electronics and applications, 2007: 1-9.
  • 6Praneet Bhatnagar, Peter Waind, Lee Coulbeck, et al. Improve- ments in SOA Ruggedness of 6.5 kV IGBTs[ J EPE, 2011 : 1-8.
  • 7sven Matthias, et al. 3300V HiPak modules for high-temperature applications [ J PCIM, 2011 : 657-662.
  • 8M Rahimo, et al. Novel Soft-Punch-Through (SPT) 1700V IGBT Sets Benchmark on Technology Curve[ J PCIM, 2001: 1-5.
  • 9S Dewar, et al. Soft Punch Through (SPT) Setting New Standards in 1200V IGBT[ J . PCIM, 2000: 1-8.
  • 10S Huang, et al. The injection efficiency controlled IGBT[ J IEEE Electron Device Letters, 2002, 23(2) : 88-90.

共引文献117

同被引文献66

引证文献7

二级引证文献11

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部