摘要
X射线断层扫描(X-ray computed microtomography,CT)技术是一种高质、高效的无损检测技术,具有无需对样品进行复杂的预处理,操作简便快捷等优点,因此其在食品领域中具有广阔的应用前景。在简要介绍CT技术的基本原理和基本装置的基础上,综述其在食品检测中的应用,并对其在食品科学领域的应用前景进行展望,以期为CT技术在食品研究中的推广提供借鉴。
X-ray computed microtomography(CT),a high quality and efficient nondestructive detection technique,is used in food science due to its usefulness for the detection of food without complicated pretreatment.In this paper,the principle and system of CT were described,and its application in food detection was reviewed.Future prospects for CT application were also discussed in order to provide a basis for the application of CT in food detection.
作者
张潮
孙钦秀
孔保华
ZHANG Chao;SUN Qin-xiu;KONG Bao-hua(College of Food Science,Northeast Agricultural University,Harbin 150030,Heilongjiang,China)
出处
《食品研究与开发》
CAS
北大核心
2020年第6期189-193,共5页
Food Research and Development
基金
“十三五”国家重点研发计划重点专项(2016YFD0401504-03)。
关键词
X射线断层扫描
食品
检测
应用
原理
X-ray computed microtomography
food
detection
application
principle
