摘要
电子设备具有长寿命、高可靠的特点,若采用传统方法对其进行寿命试验,则存在样本少、失效机理复杂、试验周期长、费用代价高的问题,为此该文给出一种针对高可靠电子产品工作寿命的综合评估方法,该方法能够充分利用已有产品在研制阶段经历的工作剖面,通过提取其中的加速应力和施加方式,利用加速试验模型,计算加速因子,再根据定型要求确定剩余寿命的考核实施方案,从而满足工程要求。
Electronic equipment has the characteristics of long life and high reliability.If the traditional methods are used to test the life of the products,there are some problems,such as less samples,complex failure mechanism,long test cycle and high cost.Therefore,this paper presents a comprehensive evaluation method for the working life of the products,which can make full use of the working profile of the existing products in the development stage,By extracting the accelerated stress and application mode and using the accelerated test model,the acceleration factor can be calculated,and then the assessment implementation scheme of the remaining life is determined according to the finalization requirements,so as to meet the engineering requirements.
作者
李静
Li Jing(No.38 Research Institute of CETC,Anhui Hefei 230000)
出处
《电子质量》
2020年第3期24-28,共5页
Electronics Quality
关键词
电子设备
工作寿命
加速因子
加速试验
lectronic equipment
working life
acceleration factor
accelerated test
