数字集成电路老化故障高精度预测方法仿真

High-precision prediction method simulation of digital integrated circuit aging fault

针对传统数字集成电路老化故障预测方法耗时较长、结果误差较大问题,提出一种新的数字集成电路老化故障高精度预测方法。该方法对数字集成电路中存在的信号进行滤波处理,去除噪声信号和冗余信号,分析滤波处理后数字集成电路特征,得到数字集成电路漏电流变化。在此基础上,分析数字集成电路中漏电流变化、阈值电压变化和延迟变化三者之间的关系,进而通过启发式算法完成数字集成电路老化程度的分类,实现数字集成电路老化故障的预测。实验结果表明,所提方法预测效率高、准确率高。

This article put forward a method of high-precision prediction for aging failure in digital integrated circuit.At first,this method filtered the signals existing in digital integrated circuits and removed noise signals and redundant signals.Then,the method analyzed the characteristic of digital integrated circuit after filtering,so as to obtain the change of leakage current in digital integrated circuits.On this basis,our method analyzed the relationship among leakage current change,threshold voltage change and delay change in digital integrated circuit.Moreover,the aging degree for digital integrated circuit was classified by heuristic algorithm.Thus,the prediction of aging failure in digital integrated circuit was achieved.Simulation results show that the proposed method has high prediction efficiency and accuracy.