基于线结构光的三维测量系统关键技术研究

Research on Key Technologies of 3D Measurement System Based on Line Structured Light

现代科学技术和信息技术的高速发展,使原有的接触式三维测量技术的局限性日益显露,难以满足当前发展中高效、全面的要求。在多种光学非接触式三维测量技术的的应用发展中,基于线结构光的三维测量技术受到关注,其凭借测量精度较高、具有实时性等特点,在测量中得到了广泛应用。

With the rapid development of modern science and technology and information technology,the limitations of the original contact 3D measurement technology are increasingly exposed,and it satisfies the current requirements for efficient and comprehensive development.A variety of optical non-contact three-dimensional measurement technologies have emerged.In the specific application development,three-dimensional measurement technology based on line structured light has attracted attention.With its relatively high measurement accuracy and real-time characteristics,Has been widely used.