摘要
数字集成电路老化会对电路的稳定性与可靠性造成一定的影响,甚至会对电路的安全性造成一定的威胁。针对此问题,对集成电路老化的概念进行了解释,分析了集成电路老化的影响因素,研究了数字集成电路两种常用的老化测试技术,即老化检测技术与老化预测技术,并对两种技术进行了对比分析,根据数字集成电路具体情况的不同,运用不同的检测技术。对集成电路老化问题的有效预防与处理提供了有效的帮助与参考。
Aging of digital integrated circuits will affect the stability and reliability of circuits to some extent,and even threaten the safety of circuits.Aiming at this problem,the concept of IC aging is explained,the influencing factors of IC aging are analyzed,two commonly used aging testing technologies of digital IC,namely aging detection technology and aging prediction technology,are studied,and the two technologies are compared and analyzed,and different testing technologies are applied according to the specific conditions of digital IC.It provides effective help and reference for the effective prevention and treatment of integrated circuit aging.
作者
费跃哲
FEI Yuezhe(The 47th Institute of China Electronics Technology Group Corporation,Shenyang 110032,China)
出处
《微处理机》
2020年第2期22-25,共4页
Microprocessors
