期刊文献+

一种新型电源板卡一体化多功能测试平台

A Novel Multi-functional Integrated Test Bench for Power Plug-in Board
下载PDF
导出
摘要 本文提出了一种新型电源板卡一体化多功能测试平台,对电源待测板卡的测试需求进行了分析与研究,建立其测试电路模型,基于LABVIEW虚拟仪器及Teststand测试序列进行分析,在此基础上完成了一体化多功能测试平台的软硬件设计与功能试验测试。试验验证了该测试平台能够对电源装置待测板卡进行快速且稳定的检测,并且系统的检测性能优于传统的板卡测试系统。 A novel multi-functional integrated test bench for power plug-in board is proposed.The test requirement of the power board is analyzed in details,and the board test sequence based on LABVIEW and Teststand is analyzed.Furthermore,the design of the software and hardware for the integrated test bench is introduced.The experimental results show that test bench can stably and rapidly complete test and the detection of the power board and is superior to the traditional test system in performance.
作者 柳彬 姚川 钟顺时 Liu Bin;Yao Chuan;Zhong Shunshi(Wuhan Second Ship Design and Research Institute,Wuhan 430064,China;Wuhan Huahai General Electric Co.,Ltd,Wuhan 430205,China)
出处 《船电技术》 2020年第2期44-47,共4页 Marine Electric & Electronic Engineering
关键词 测试平台 电源板卡 虚拟仪器 test bench power board card LABVIEW
  • 相关文献

参考文献4

二级参考文献21

  • 1于劲松,李行善.下一代自动测试系统体系结构与关键技术[J].计算机测量与控制,2005,13(1):1-3. 被引量:91
  • 2刘浩,朱小平.ATLAS语言在自动测试设备ATE中的应用实践[J].计算机测量与控制,2005,13(2):118-119. 被引量:11
  • 3IEEE Std 1641.IEEE Standard for Signal and Test Definition(STD)[S].2004,2006,2010.
  • 4IEEE Std 1671.IEEE Standard for Automatic Test Markup Language(ATML)for Exchanging Automatic Test Equipment and Test Information via XML[S].2010.
  • 5IEEE Std 1232.IEEE Draft Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments(Al-ESTATE)[S].1995,2002,2010.
  • 6IEEE Std 1226.1,.2.3.IEEE Draft Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments(M-ESTATE)[S].1993,1998.
  • 7IEEE Std 1636.IEEE Trial-Use Standard for Software Inter face for Maintenance Information Collection and Analysis(SIMICA)[S].2009.
  • 8IEEE Std 1445.IEEE Standard for Digital Test Interchange Format(DTIF)[S].1998.
  • 9IEEE Std 1546.IEEE Guide for Digital Test Interchange Format(DTIF)Application[S].2000.
  • 10贾国龙,陈思平,赵文龙.一种通用的电路板自动测试系统的设计与实现[J].科技情报开发与经济,2009,19(5):150-153. 被引量:1

共引文献40

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部