基于四组加速退化试验的VFD寿命预测

Life prediction of VFD based on four groups of accelerated degradation tests

为在短时间内准确获得真空荧光显示器的寿命信息,该文在提高阴极灯丝温度的基础上开展四组恒定应力作用下的加速退化试验,利用加速时间与加速系数的关系将加速应下的试验数据转化为常规应力下的亮度衰减数据,基于三参数威布尔函数和右逼近法建立寿命预测模型,从而实现寿命的估算。结果表明,加速退化试验方案切实可行,基于亮度衰减的寿命模型不仅准确揭示亮度随时间的变化规律,而且具有较高的预测精度,可为制造商和用户提供技术参考,并可推广到其他光电产品。

Aiming at obtaining the life information of vacuum fluorescent display in a short time,accelerated degradation tests under four groups of constant stresses are carried out on the basis of increasing the temperature of the cathode filament.The relationship between accelerated time and the acceleration coefficient is applied to transform the test data at accelerated stress into the luminance attenuation data under normal stress,and the life prediction model based on three-parameter Weibull function and right approximation method is established,thus achieving the life estimation.The results indicate that the accelerated degradation test scheme is feasible,and the life model based on luminance attenuation not only accurately reveals the rule of brightness changing with time,but also has high prediction accuracy,which can provide manufacturers and users with important technical references and can be generalized to other optoelectronic products.