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某机载电子系统低温启动故障分析

Analysis of a Start-up Failure in Airborne Electronic Systemunder Low Temperature
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摘要 该文针对某机载电子系统环境试验过程中出现的低温启动故障,首先,采用故障树法对各个因素进行排除实现了故障定位,确定了CAN接口芯片在低温启动时的某种故障模式,然后根据故障机理在板级电路和整机系统实现了故障的稳定复现,证明了故障定位的准确性;最后制定了改进措施并通过试验验证了措施的有效性。 A start-up failure in airborne electronic system under low temperature is analyzed in this paper.With a fault tree,various causes are eliminated and the fault location is found.A certain fault mode of CAN interface chip in the low-temperature start-up is determined.Then,according to the fault mechanism,the stable recurrence of the fault is realized in the board level circuit and the whole system,which proves the accuracy of the fault location.Finally,the improvement measures are made and the effectiveness of the measures is verified by experiments.
作者 孙瑞婷 周流畅 Sun Rui-ting;Zhou Liu-chang(CSIC 723 Institute,Jiangsu Yangzhou 225001)
出处 《电子质量》 2020年第4期29-32,共4页 Electronics Quality
关键词 低温启动 故障分析 故障树 故障复现 接口芯片 CAN Low temperature starting failureanalysis fault tree failure replay interface chip CAN
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  • 1霍曼,邓中卫.国外军用飞机航空电子系统发展趋势[J].航空电子技术,2004,35(4):5-10. 被引量:66
  • 2贾丽岩.航电设备故障测试和维修的新挑战[J].航空维修与工程,2006(4):50-51. 被引量:2
  • 3弗兰克.杰克曼,成磊.民用航空维修市场预测[J].航空维修与工程,2006(4):10-11. 被引量:2
  • 4比尔.伯切尔,时杰.航电设备的“未发现故障”[J].国际航空,2007(5):50-50. 被引量:2
  • 5MIL-HDBK-1814: Integrated diagnostics[S].
  • 6Andrew Hess. PHM a key enabler for the JSF autonomic logistics support concept[C]. 2004 IEEE Aerospace Conf Proc. New York: IEEE Press, 2004: 20-32.
  • 7Kai Goebel, Bhaskar Saha, Jose R. Prognostics in battery health management[J]. IEEE Instrumentation & Measurement Magazine, 2008, 29(8): 33-40.
  • 8Vichare N, Michael G P. Prognostics and health management of electronics[J]. IEEE Trans on Components and Packaging Technologies, 2006, 29(1): 222-229.
  • 9Zhang S N, Kang R, He X F. China's efforts in prognostics and health management[J]. IEEE Trans on Component and Packaging Technologies, 2008, 31(2): 509-517.
  • 10Deb S, Pattipati K R, Krishna R, et al. Multi-signal flow graphs: A novel approach for system testability analysis and fault diagnosis[J]. IEEE Aerospace and Electronics Magazine, 1995, 10(5): 14-25.

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