摘要
广泛研究了在MRI系统中的医疗器械射频致热问题。采用全波电磁仿真和热仿真工具,研究了器械长度与器械尖端周围的最大温升的相关性。测试结果显示,“最坏情况”的温升测量结果与仿真数据一致。该工作提出了一种高效、准确的方法,用来评估多种不同尺寸的医疗器械在磁共振环境下的射频致热情况。
The primary contribution of this work is the extensive studies of medical devices RF-induced heating problems in MRI systems.Full-wave electromagnetic simulation and thermal simulation tools are used to find a correlation between device length and the maximum temperature increment around the device tip.Measurement results for the worst-case heating scenario are in good agreement with simulation data.The work proposed an efficient and accurate method to evaluate the MRI RF-induced heating effect for a device family with a large number of length variation.
