双列表面芯片外观检测方法研究

随着自动化设备的发展,视觉检测扮演着越来越重要的角色。其中双列表面芯片外观检测方法是根据已有的图片模板,按照所检测的内容提取模板中的特征参数,再根据特征参数对待测产品进行严格筛选,降低了工作难度,提高了工作效率。基于此,从芯片定位、图片矫正、引脚检测、字符分割4个方面研究了基于图像处理技术的双列表面芯片外观检测的识别方法,并对现有的芯片外观方法进行了简单改进。

With the development of automation equipment,visual inspection plays an increasingly important role.The double-column surface chip appearance detection method is to extract the feature parameters in the template according to the content detected according to the existing picture template,and then strictly screen the tested products according to the feature parameters,which reduces the work difficulty and improves the work efficiency.Based on this,the recognition method of dual-array surface chip appearance detection based on image processing technology is studied from four aspects,including chip positioning,image correction,pin detection and character segmentation,and the existing chip appearance detection method is simply improved.