摘要
PbZrxTi1-xO3(PZT)fims are fabricated on F-doped tin oxide(FTO)substrates using chemical solutions containing PVP polymer and rapid thermal annealing processing.The dependence of the layered PZT multilayer formation and their optical properties on the Zr content x are examined.It is found that all the PZT films are crystallized and exhibit 110-preferred orientation.When x varies in the region of 0-0.8,the PZT films display lamellar structures,and a high reflection band occurs in each optical reflectance spectrum curve.Especially,those PZT fikms with Zr/Ti atomic ratio of 35/65-65/35 show clearly layered cross-sectional morphologies arranged alternatively by porous and dense PZT layers,and have a peak optical reflectivity of>70%and a band width of>45 nm.To obtain the optimal Bragg reflection performance of the PZT multilayers,the Zr content should be selected in the range of 0.35-0.65.
基金
the Frontier Science Research Project of Chinese Academy of Sciences(No.QYZDJ-SSW-SLH018)
the National Natural Science Foundation of China(Nos.11174307 and 11933006)
the National Key Basic Research Program of China(No.2016YFB0402405).
