基于V93k ATE的SoC芯片输出不稳定的测试方法

Realization of Output Instability Testing Method of SoC Chip Based on V93k ATE

分析表明,大多数SoC芯片是基于锁相环倍频外部时钟或内部时钟来运行的,而芯片之间的加工工艺存在细微差异,导致各个芯片工作可能的存在时序差异。即使同一颗芯片在不同的电压和温度的条件下,其工作时序也存在一定差异。针对芯片波形时序不稳定的情况,介绍一种基于V93k ATE的波形转换跟踪的测试方法。

The analysis shows that most SoC chip is based on frequency multiplication phaselocked loop external clock or internal clock to work.However,there are slight differences in processing technology between the chips,which may lead to timing differences in the work of each chip.Even if the same chip at different voltage and temperature conditions,the work timing sequence is also different.In view of the instability of chip waveform timing,this paper introduces a testing method of waveform conversion tracking based on V93k ATE.