摘要
本文系统介绍了针对冶金、机械制造、机械加工等领域材料中元素含量分析中的谱线干扰校正问题。干扰元素的扣除对提高元素的精确度有着重要的意义,系统提出了原子发射光谱元素强度-强度模型干扰校正法模型、推导等内容。
In this paper,the accurate analysis of element concentrations analysis of spectral line interference correction method in metallurgy,mechanical manufacturing and machining and other fields.The deduction of interference elements is of great significance to improve the accuracy of elements.Establishment and derivation of the correction model of element intensity--intensity interference model.
作者
马增
MA Zeng(Tianjin Jingliwei Technology Co.,Ltd.,Tianjin 300000)
出处
《数字技术与应用》
2020年第5期79-80,82,共3页
Digital Technology & Application
关键词
原子发射
谱线干扰
谱线重叠
谱线强度
atomic emission
spectral line interference
spectral line overlap
spectral line Intensity