基于CYCIAE-100中能质子回旋加速器的单粒子效应敏感度评估

Single event sensitivity evaluation by using medium-energy proton accelerated by CYCIAE-100 cyclotron

针对基于SRAM型FPGA实现的系统的单粒子效应敏感度评估,采用北京放射性核束装置CYCIAE-100回旋加速器提供的中能质子进行辐照试验研究。以典型SRAM型FPGA器件XC4VSX55为试验样品,获得其本征单粒子翻转截面以及特定应用下的翻转位数与功能错误数的比例关系;并将结果与在瑞士PSI质子辐照装置获得的试验结果进行比较。此外,提出针对基于SRAM型FPGA实现的系统的两步骤单粒子翻转敏感度评估方法,可以定量评估器件在轨功能错误数。本工作同时表明CYCIAE-100提供的长射程的质子,对于倒装器件的单粒子翻转敏感度评估具有重要价值。

This paper makes the single event sensitivity evaluation of SRAM-based FPGA designs by using the medium-energy protons accelerated by the CYCIAE-100 cyclotron,Beijing Radioactive Ion-beam Facility.The device(DUT)is a typical SRAM based FPGA(Field-Programmable Gate Array).The intrinsic SEU cross sections are obtained,and the ratio of the upsets to the function errors for a certain application are compared with those acquired by using the proton irradiation facility of Paul Scherrer Institut(PSI),Switzerland.A two-stage method for the single event sensitivity evaluation is proposed for FPGA applications,by which the functional errors in orbit can be estimated.The CYCIAE-100 can provide long-range high-energy protons and will play an important role in the single event sensitivity evaluation especially for flip-chip packaged devices.