基于成像极化浊度计的颗粒粒径检测技术

Particle Size Detection Technology Based on Imaging Polarization Nephelometer

根据米散射理论,设计了以532nm激光器为光源、CCD为探测器的极化浊度计。对粒径为2μm的聚苯乙烯标准粒子(PSL)进行检测,得到了PSL的散射相函数,将其与偏振角为0°和90°的2μm球形粒子的理论散射相函数进行对比,拟合度分别达到87.3%与88.4%。采用Chahine迭代算法反演得到PSL的粒径为1.94μm,接近其真实值。将极化浊度计与宽范围颗粒粒径谱仪和扫描电镜的检测结果进行对比,结果表明,该装置检测精度高,且不受人为主观因素影响,对颗粒粒径的准确检测有重要意义,在相关领域应用前景较好。

According to the theory of Mie scattering,apolarization nephelometer composed of 532 nm laser as light source and charge-coupled device as detector was designed.Standard polystyrene latex(PSL)particles with particle size of 2μm was measured,and the scattering phase function of the PSL was obtained.Compared with the theoretical scattering phase function of 2μm spherical particles with polarization angle of 0°and 90°,the fitting degree was 87.3%and 88.4%,respectively.Chahine iteration algorithm was used to inverse the particle size of the PSL,the measured particle size was 1.94μm,which was close to the real particle size.The results of polar nephelometer were compared with those of wide range particle size spectrometer and scanning electron microscopy.The results show that the detection precision of the device is high and not affected by subjective factors.The device is of great significance for the accurate detection of particle size,which has good application potential in related field.