基于STM32的X射线测厚仪设计

The Design of X-ray Thickness Gauge Based on STM32

为了满足对金属板厚度的测量精度要求,文章利用STM32作为控制系统,设计了一种小型化、高精度的X射线测厚仪。该测厚仪采用全桥逆变电路提高电源工作频率,减小了高频变压器的体积,同时采用双向倍压整流电路升压,与传统倍压整流电路相比降低了器件内部压降和整流之后的纹波。实验表明,该测厚仪不仅体积减小了,而且工作稳定,灵敏度可达到0.0001 mm。该设计具有一定的应用价值。

In order to meet the requirement of measurement accuracy of metal plate thickness,a miniaturized and high-precision X-ray thickness gauge is designed by using STM32 as the control system.The full bridge inverter circuit is used to increase the working frequency of the power supply and reduce the volume of the high frequency transformer.At the same time,the double voltage rectifier is used to boost the vo-ltage,which reduces the internal voltage drop and the ripple after rectification compared with the traditional double voltage rectifier.The experimental results show that the thickness gauge can not only reduce the vo-lume of the thickness gauge,but also work stably with a sensitivity of 0.0001mm.This design has certain application value.