基于SIW-CSRR的固体物质介电常数测试件设计

Design of Solid Material Dielectric Constant Measurement Device Based on SIW-CSRR

为满足当前固体物质介电常数的检测需求,在基片集成波导(SIW)的基础上加载互补开口谐振环(CSRR),设计了一款固体物质介电常数测试件,讨论了利用测试件谐振频率的偏移检测固体物质介电常数的可行性。仿真与测试结果表明,当检测物质相对介电常数从1变化至10时,测试件谐振频点从7.56 GHz偏移至6.28 GHz,偏移量达1.28 GHz。利用谐振频点与测试样品介电常数的关系,测量了5种常见电路板材的相对介电常数,其相对误差均低于3%。

In order to measure the dielectric constant of solid substances,a device is designed by loading complementary split-ring resonator on the base of substrate integrated waveguide.Simulation and measurement results show that when the relative dielectric constant of the measured material changes from 1 to 10,the resonant frequency point of the device shifts from 7.56 GHz to 6.28 GHz,and the offset can reach 1.28 GHz.By the relationship between the resonance frequency and the dielectric constant of the measured samples,the relative dielectric constants of the five common circuit boards are measured,and the relative errors are less than 3%.