新型3D合金屏蔽效能的MCNP模拟

MCNP Simulation of Shielding Effectiveness of New Type 3D Alloy

用Monte Carlo程序(MCNP)模拟研究不同掺杂组分与不同掺杂质量分数合金对低能X射线谱的屏蔽效能.模拟结果表明:合金的屏蔽效能与掺杂组分原子序数呈正相关,与掺杂质量分数呈正相关(ΔZ>0)或负相关(ΔZ<0);ΔZ绝对值越大,合金的屏蔽效能变化越大,且变化幅度与掺杂质量分数呈正相关;TaW合金的屏蔽效能最好,掺杂质量分数的变化对其屏蔽性能影响最小;在低能能谱范围内,不同能量X射线透射率的MCNP模拟结果与实验结果基本一致.

Monte Carlo program was used to simulate the shielding effectiveness of different adulterants and mass fraction of adulterant for a X-ray spectrum at low energy.The simulation results show that the alloy shielding effectiveness has a positive correlation with atomic number of adulterant,and a positive correlation(ΔZ>0)or a negative correlation(ΔZ<0)with mass fraction of adulterant.With the increases of the absolute valueΔZ,the variation of shielding effectiveness is getting lager,and the variation range has a positive correlation with mass fraction of adulterant.The shielding effectiveness of TaW alloy is the best and is nearly not affected by the variation of mass fraction of adulterant.The transmission rate of different low energy X-ray obtained by MCNP simulation shows good agreement with the experimental value.