摘要
A new X-ray imaging technique can penetrate the layers of a computer chip and reveal its secrets—while keeping it intact.The method,called ptychographic X-ray laminography,should be useful for reverse engineering chips,verifying chip designs,and identifying counterfeits.It could also be useful in other branches of science and engineering for zooming in on the three-dimensional(3D)structure of any sample with a planar geometry.
