基于Ultraflex的芯片上升时间测量的研究

Research on IC Rising Time Measurement on Ultraflex

在ATE测试中,芯片上升时间的传统测量方法,具有测试步骤较多、耗时比较长的特点,会给芯片的量产增加很多测试成本。基于UltraFlex测试机,以芯片管脚信号上升时间为研究对象,实践传统测试方式,并探索一种能够快速且满足测试精度要求的高效测量方法。这种方法的思路,可以供其他的芯片时间参数测试参考。

In ATE testing,traditional rising time tests of ICs are time-consuming and have lots of procedures,increasing high testing cost in IC manufacture.Based on the rising time test on UltraFlex,this paper researches traditional methods to measure rising time of IC and introduces one new method for rising time test,costing less test time and keeping accuracy.It also can be considered in other timing parameter tests.