基于红外光谱偏振度对比度的涂层材质识别研究

Research on coating materials detection and recognition based on infrared spectral polarization degree contrast

为了降低材质红外识别的正确率,较常用的方法是通过在材质表面涂覆涂层,以改变材质的表面发射率。首先通过基于微面元理论的目标材质表面红外辐射偏振传输模型的Stokes表达式,推导分析了目标材质表面发射率对目标材质表面红外偏振特性的影响,结果表明:目标材质表面发射率的改变不影响其表面的红外线偏振度特征;其次,针对材质表面发射率与红外偏振特性的不相关性,文章提出基于光谱偏振度对比度检测涂层材质的方法,并通过相同基底不同表面发射率的涂层材质、不同基底相同发射率的涂层材质的红外高光谱偏振成像特性进行了验证分析,结果表明:改变涂覆材料表面发射率并不影响材质表面的红外光谱偏振度特征;基底材料不同,即使目标材质表面涂覆相同发射率涂层,其表面的光谱偏振度特性将比光谱辐射亮度具有更明显的差异性,研究成果可为红外伪装材质检测识别提供新的途径和方法。

In order to reduce the accuracy of material infrared recognition,a common method was presented to change the emissivity of material surface by coating the material surface.Firstly,the influence of the surface emissivity of the target material on the infrared characteristics of the target material was deduced and analyzed through the Stokes expression of the infrared radiation polarization transmission model of the target material based on the micro-plane element theory.The theoretical analysis results show that the change of the surface emissivity of the target material does not affect the infrared polarization of the surface.Secondly,in view of the irrelevance between the material surface emissivity and infrared polarization characteristics,this method of coating material was proposed based on the spectral degree of polarization contrast.And the infrared hyperspectral polarization imaging characteristics of coating materials with different surface emissivities on the same substrate and coating materials with the same emissivity on different substrates were verified and analyzed.The results show that the change of the surface emissivity of the coated material does not affect the polarization degree of the infrared spectrum.And even if the target material is coated with the same emissivity coating,the characteristic of spectral polarization degree is more obviously different than that of spectral radiation brightness.The research results can provide a new method for infrared camouflage material detection and recognition.