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基于复眼阵列的红外制导装置箱内检测技术

Embedded testing technology of infrared guidance device in the storage tank based on compound eyes array
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摘要 针对红外成像制导装置箱内贮存的光学性能标定检测,以及其全生命周期的寿命评估和预测需求,提出了基于复眼阵列逆合成孔径成像的阵地检测新原理,利用每一个透镜单元所承担的光束孔径共同构成检测系统的出瞳,实现了红外平行光模拟检测装置的超薄化、贮存箱内嵌入式设计,研制了大出瞳直径、短焦红外制导装置箱内检测系统样机,并通过中波热像仪进行了成像像质验证,为降低导弹阵地关键光学参数检测的技术准备时间和综合检测成本、控制检测风险提供了技术支持。 Aiming at the calibration and testing of the infrared imaging guidance device’s optical performance in the storage period,as well as the requirements of the life assessment and prediction in the full-life-cycle,this paper proposes a new position testing technology based on the inverse synthetic aperture imaging principle using the compound eyes array.The pupil of the testing system is composed of the beams’aperture of each lens unit and the ultra-thin parallel infrared light simulation testing device is available in the storage tank by the embedded design.With a large pupil diameter and short focus,the prototype of an embedded testing system for infrared guidance device is developed and the imaging quality is verified by a midium wave infrared radiation(MWIR)imager.It provides a technical support for the missile’s key optical parameters position testing in saving the technical preparation time,reducing the comprehen sive testing cost and avoiding the testing risk.
作者 郭鑫民 杨振 杨克君 张建隆 王晔 GUO Xinmin;YANG Zhen;YANG Kejun;ZHANG Jianlong;WANG Ye(School of Astronautics,Harbin Institute of Technology,Harbin 150001,China;Harbin Xin-guang Opto-electronic Co.,Ltd.,Harbin 150028,China;Beijing Electro-Mechanical Engineering Institute,Beijing 100074,China)
出处 《系统工程与电子技术》 EI CSCD 北大核心 2020年第8期1668-1672,共5页 Systems Engineering and Electronics
关键词 光学系统嵌入式检测 红外标定检测系统 复眼透镜阵列 超薄平行光管 optical system embedded testing infrared calibration evaluation system compound eyes lens array ultra-thin collimator
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