碳酸钠分离-二苯碳酰二肼光度法测定工业硅中铬的实验条件探讨

Discussion on Experimental Conditions for Determination of Chromium in Industrial Silicon by Sodium Carbonate Separation-Diphenylcarbazide Photometric Method

本文提出了用碳酸钠分离-二苯碳酰二肼光度法测定工业硅中的高含量银。考察了高锰酸钾加入量、硫酸锰加入量、二苯碳酰二肼加入量、定容pH、硫酸加入量和显色后放置时间对测试结果的影响,并对干扰离子进行了研究,并考察了方法准确度和精密度。结果表明:用碳酸钠分离-二苯碳酰二肼光度法测定工业硅中0.0010%~0.0500%的铬量,测试结果回收率为95%~105%,满足准确度和精密度的要求。

This paper proposes the determination of high content silver in silicon metal by diphenylcarbazide spectrophotometry using sodium carbonate separation.The effects of the addition amount of potassium permanganate,the addition amount of manganese sulfate,the addition amount of diphenylcarbazide,the constant volume pH,the addition amount of sulfuric acid and the placing time after color development on the test results were investigated,and the interference ions and the accuracy and precision of the method are also investigated.The results show that:using sodium carbonate separation-diphenylcarbazide photometric method to determine 0.0010%~0.0500%of chromium in silicon metal,the test results recovery rate is 95%~105%,which meets the requirements of accuracy and precision.