摘要
The analytical description of the trap signature in the charge conduction process of turmeric dye-based organic semiconductor has been presented in this study.An analytical explanation of the built-in potential Ⅴx-Ⅴ graph that emphasizes the presence of trapping states has been provided.Differential analysis of current-voltage(Ⅰ-Ⅴ)characteristics has also been conducted to verify the trap signature of the carrier in the device.The non-monotonous decrement of the G(Ⅴ)-Ⅴ plot verifies the trap signature.The values of trap energy(Et)and trap factor(θ)have been derived from the logarithmic Ⅰ-Ⅴ relationship.From the analysis of the semilogarithmic Ⅰ-Ⅴ plot,the barrier height(ϕbi)of the device has also been determined.The overallⅠ-Ⅴcurve has been taken into account to examine the Richardson-Schottky and Poole-Frenkel effects on the trap-assisted charge conduction process.From the results of the experiment,the Schottky effect has been observed to be effective,which leads to a bulk-limited charge conduction process.
