电子元器件低频电噪声测试关键技术研究

Research on Key Technology of Low Frequency Electrical Noise Measurement for Electronic Components

电子元器件的缺陷之处,主要呈现在载流子微观运动中,这项微观运动会导致电子元件出现低频噪声。文章主要对电子元器件低频微观噪声进行噪声模型建立,同时对噪声模型的相应参数进行了介绍,主要通过几大方面进行噪声测试技术原理的分析,分别是偏置技术、放大技术、数据处理技术,同时对这些技术在电阻元器件噪声测试中的应用效果进行了观察表述。

The defects of electronic components mainly appear in the carrier micro motion,which will lead to low-frequency noise of electronic components.In this paper,the low-frequency micro noise model of electronic components is established,and the corresponding parameters of the noise model are introduced.The principle of noise testing technology is analyzed in several aspects,including bias technology,amplification technology and data processing technology.At the same time,the application effect of these technologies in the noise testing of resistance components is observed.