基于LK8810S平台的DAC数字芯片的性能评估及研究

Evaluation and Research on the Performance of DAC Digital Chip Based on LK8810S Platform

随着集成电路技术的快速发展,数字芯片集成度的提高,数字芯片引脚数量及高速信号种类的增多,对于高性能数字芯片的测试验证分析难度越来越大。文章基于当前数字芯片的测试技术在平台上的测试验证需求,依据DAC芯片的参数测试的原理和方法,以DAC0808为例,通过设计硬件电路和软件测试两方面结合的方式,对关键参数及芯片功能进行基于LK8810S平台测试系统的测试研究,可以提高测试结果的准确性。

With the rapid development of integrated circuit technology,the improvement in the integration of digital chips,the increase in the number of digital chip pins and varieties of high-speed signals,it becomes increasingly difficult to test and analyze the high-performance digital chips.Based on the current requirement of digital chip testing technology on the platform and according to the principles and methods of DAC chip parameter testing,this paper,taking DAC0808 as an example,tests the key parameters and chip function based on LK8810S platform testing system through a combination of hardware circuit and software testing,which improves the accuracy of the test results.