摘要
基于对IC做ATE量产测试是对每一颗IC检测和判断功能是否达到设计要求的重要标准,也是IC从设计到生产再到上市整个过程中的一个重要环节。为了提高设计效率和质量,阐述工程师需要了解ATE测试的基本原理和结构,并运用各种工具,总结贯通,建立定式模板,以达到提高效率与质量的目的。
Based on the ate mass production test of IC is an important standard for each IC to detect and judge whether the function meets the design requirements,and also an important link in the whole process of IC from design to production and then to market.In order to improve the efficiency and quality of design,this paper describes that engineers need to understand the basic principle and structure of ATE test,and use various tools to summarize and link up,and establish a fixed template to achieve the purpose of improving efficiency and quality.
作者
陶雪芬
TAO Xuefen(Giga Force Electronics Co.,Ltd,Shanghai 201203,China)
出处
《集成电路应用》
2020年第7期42-44,共3页
Application of IC
基金
上海市科技企业技术创新课题项目。