扫描电子显微镜在三元材料包覆改性中的应用

Application of Scanning Electron Microscope in Coating Modification of Ternary Materials

三元材料具有安全性能差、高温稳定性差等缺点。可通过掺杂和包覆改性晶体结构来抑制高温、高电压下副反应发生,防止晶体内部坍塌。材料表面分析技术可表征三元材料改性后晶体结构变化,本文通过扫描电子显微镜的二次电子、背散射电子、特征X射线这三种接收信号,综合分析三元材料包覆改性后表面包覆物的形貌、组成及包覆层厚度。

Ternary materials have the disadvantages of poor safety performance and poor high temperature stability.The modified crystal structure can be doped and coated to inhibit the side reaction at high temperature and high voltage and prevent the inner collapse of the crystal.By means of scanning electron microscopy,backscattering electron,characteristic X ray,the morphology,composition and thickness of the surface coating of ternary materials were analyzed.