摘要
针对更加精确地对亚米级影像进行正射纠正应用时存在不利因素的问题,该文通过对资源三号立体像对的相对定向、绝对定向、核线匹配等方法提取数字表面模型。结合不同侧摆角的北京二号、高分二号亚米级卫星遥感影像数据,选取不同分辨率的DEM对不同侧摆角的亚米级卫星影像进行正射纠正实验,并对其进行精度评价。实验结果表明:侧摆角的大小对正射纠正的误差有影响,以同一DEM作为控制,当侧摆角增大时,正射纠正的整体误差呈现上升的趋势;不同分辨率的DEM对平差精度影响不大;不同分辨率的DEM对正射纠正精度影响相对较大,尤其山区地形变化较大。通过本文方法利用资源三号立体像对提取的DSM进行正射纠正的精度明显优于30 m和90 m分辨率的DEM,说明资源三号具有现势性。
In order to perform orthographic correction of submitter images more accurately and solve the problem of adverse factors in application.In this paper,the digital surface model is extracted by relative orientation,absolute orientation,kernel line matching and so on.Combining with the remote sensing image data of BJ-2 and GF-2 sub-meter satellites with different lateral pendulum angles,DEM of different resolutions were selected to carry out orthographic correction experiment and accuracy evaluation on sub-meter satellite images with different lateral pendulum angles.The experimental results show that the lateral pendulum Angle has an effect on the orthodontic error.With the same DEM as the control,when the lateral pendulum Angle increases,the overall error of orthodontic correction also shows an upward trend;and DEM with different resolution has little effect on adjustment accuracy.DEM with different resolutions has a great influence on the accuracy of orthodontic correction,especially in mountainous areas.By using the method in this paper,the accuracy of orthodontic correction of extracted DSM by using the ZY-3 is obviously better than DEM with resolutions of 30 meters and 90 meters,which also indicates that resource iii is a trend.
作者
王崇倡
李佳赫
李鸿洲
代建军
WANG Chongchang;LI Jiahe;LI Hongzhou;DAI Jianjun(Liaoning Technical University,Fuxin,Liaoning 123000,China;Land Satellite Remote Sensing Application Center,MNR,Beijing 100048,China;The Second Surveying and Mapping Engineering in Heilongjiang Province,Harbin 150000,China)
出处
《测绘科学》
CSCD
北大核心
2020年第7期106-112,共7页
Science of Surveying and Mapping
关键词
数字高程模型
正射纠正
侧视角
亚米级卫星遥感影像
精度评价
DEM
ortho rectification
swinging angle
satellite remote sensing image with sub-meters accuracy
accuracy