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640×512数字化InGaAs探测器组件 被引量:3

640×512 digital InGaAs detector assembly
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摘要 数字化InGaAs探测器是短波红外探测器技术发展的一个重要方向,它不仅可以提升系统的集成度,还可以提升成像系统的各项技术指标。通过将模拟-数字转换器(ADC)集成到读出电路中实现数字化读出电路是数字化InGaAs探测器的技术核心。文中介绍了640×512数字化读出电路的设计与实现,并与InGaAs探测器通过铟柱进行倒装互联形成了数字化InGaAs探测器组件。通过对探测器组件的测试得到读出噪声为230μV,峰值量子效率为65%,在300 K温度下探测率为1.2×10^12 cmHz1/2/W,在60 Hz帧频下功耗为94 mW。测试结果表明,数字化InGaAs探测器组件具有低读出噪声,高线性度,高传输带宽,高抗干扰性等特点。 Digital InGaAs detector significantly orients the development of short wave(SW)infrared detector technology,it not only can increase integrated level of the system,but also can develop the imager’s performance.The key point to realize the digital InGaAs detector is integrating ADC into the readout integrated circuit(ROIC)and realize digital ROIC(DROIC).The 640×512 DROIC was designed and fabricated,it interconnected InGaAs detector focal plane array with In and realized digital InGaAs detector assembly.The proposed digital InGaAs detector assembly was tested,and the measurement results show that its readout noise is 230μV,peak quantum efficiency is 65%,detectivity under 300 K temperature is 1.2×1012 cm Hz1/2/W,and the power consumption is 94 mW when frame rate is 60 Hz.The measurement results indicate that the digital InGaAs detector assembly has some features as low readout noise,high linearity,wide transmission bandwidth,good resistance to interference and so on.
作者 钟昇佑 陈楠 范明国 张济清 朱琴 姚立斌 Zhong Shengyou;Chen Nan;Fan Mingguo;Zhang Jiqing;Zhu Qin;Yao Libin(Kunming Institute of Physics,Kunming 650223,China)
机构地区 昆明物理研究所
出处 《红外与激光工程》 EI CSCD 北大核心 2020年第7期61-68,共8页 Infrared and Laser Engineering
关键词 INGAAS探测器 数字化读出电路 列级ADC 数字化探测器组件 InGaAs detector digital readout circuit column level ADC digital detector assembly
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