摘要
采用掠入射X射线衍射(GIXRD)、弹性离子反冲(ERD)、氦热解吸(TDS)、扫描电镜(SEM)对直流磁控溅射法制备的含氦Zr-Co、Zr-Ti-Co薄膜进行分析,分别得到样品物相、氦的深度和浓度分布、氦热解吸图谱以及热解吸前后的表面形貌。氦热解吸实验曲线反映出Ti的掺杂有利于抑制ZrCo贮氚合金中氦的迁移、聚集和发展,提升相应捕陷位置中氦的释放温度;氦热解吸后,Zr 0.8 Ti 0.2 Co薄膜样品的晶界密度相比ZrCo薄膜样品更低,降低减少了氦泡迁移的通道,延缓高温下氦泡迁移合并的趋势,表明掺杂Ti可提升ZrCo合金的固氦能力,对高温条件下氦的释放具有抑制作用。
In this study,grazing incidence X-ray diffraction(GIXRD),elastic recoil detection(ERD),thermal desorption spectroscopy(TDS)and scanning electron microscope(SEM)were used to analyze helium-containing Zr-Co and Zr-Ti-Co films prepared by direct current magnetron sputtering,and the sample phase,the depth and concentration distribution of helium,helium thermal desorption spectrometry and surface morphology before and after thermal desorption were obtained.The helium thermal desorption experiment shows that Ti doping is beneficial to inhibit the migration,accumulation and evolution of helium in ZrCo tritium storage alloy and increase the release temperature of helium in corresponding trapping sites.After helium thermal desorption,the grain boundary density of Zr 0.8 Ti 0.2 Co films is lower than that of ZrCo films,which reduces the helium bubble migration channel and delays the helium bubble migration and merger trend at high temperature,indicating that Ti-doped can improve the helium retention property of ZrCo alloy and inhibit the helium release at high temperature.
作者
蒋富冬
张光辉
熊义富
唐涛
桑革
于荣海
敬文勇
Jiang Fudong;Zhang Guanghui;Xiong Yifu;Tang Tao;Sang Ge;Yu Ronghai;Jing Wenyong(Institute of Materials,China Academy of Engineering Physics,Mianyang 621907,China;Beihang University,Beijing 100191,China)
出处
《钛工业进展》
CAS
北大核心
2020年第4期29-34,共6页
Titanium Industry Progress
基金
国家青年基金项目(21601165)
国家重点基金项目(21573200)
国家面上基金项目(51731002)。
关键词
Ti掺杂
ZrCo合金
氦热解吸
固氦能力
磁控溅射
Ti-doped
ZrCo alloy
helium thermal desorption
helium retention property
magnetron sputtering