一种提取多层印制电路微波过渡特性的方法

A Method to Extract Microwave Transition Characters of a Multilayer Printed Circuit

针对多层电路过渡结构的微波性能参数提取问题,提出了一种逐步增加过渡结构的设计方法。该方法建立了多个通道间插入损耗的数学关系,通过对插入损耗的测试值进行运算处理,得到各过渡结构的微波特性参数。最后用该方法提取了一种多层电路过渡结构的微波性能参数,包括垂直过渡损耗、水平过渡损耗、直角过渡损耗、单位长度传输线损耗。提取结果可为使用该叠层结构的微波电路设计提供参考。

To extract the microwave transition characters of a multilayer printed circuit,a method was proposed.The circuit was designed by establishing the mathematical relationship of each channel,then process the test data to get the microwave transition characters.Finally,we used this method to extract the microwave transition characters of a multilayer printed circuit,including the vertical transit loss,the horizontal transit loss,the right-angle transit loss and the loss of a unit transmission line.The results can provide a reference for the design of microwave circuit using the stack.