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Temperature-switching logic in MoS2 single transistors

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摘要 Due to their unique characteristics,two-dimensional(2D)materials have drawn great attention as promising candidates for the next generation of integrated circuits,which generate a calculation unit with a new working mechanism,called a logic transistor.To figure out the application prospects of logic transistors,exploring the temperature dependence of logic characteristics is important.In this work,we explore the temperature effect on the electrical characteristic of a logic transistor,finding that changes in temperature cause transformation in the calculation:logical output converts from‘AND’at 10 K to‘OR’at 250 K.The transformation phenomenon of temperature regulation in logical output is caused by energy band which decreases with increasing temperature.In the experiment,the indirect band gap of MoS2 shows an obvious decrease from 1.581 eV to 1.535 eV as the temperature increases from 10 K to 250 K.The change of threshold voltage with temperature is consistent with the energy band,which confirms the theoretical analysis.Therefore,as a promising material for future integrated circuits,the demonstrated characteristic of 2D transistors suggests possible application for future functional devices.
作者 陈孝章 顾乐华 刘岚 陈华威 栗敬俣 刘春森 周鹏 Xiaozhang Chen;Lehua Gu;Lan Liu;Huawei Chen;Jingyu Li;Chunsen Liu;Peng Zhou(The State Key Laboratory of ASIC and System,Department of Microelectronics,Fudan University,Shanghai 200433,China;Department of Physics,State Key Laboratory of Surface Physics,Key Laboratory of Micro and Nano Photonic Structures(Ministry of Education),and Institute for Nanoelectronic Devices and Quantum Computing,Fudan University,Shanghai 200433,China;School of Computer Science,Fudan University,Shanghai 200433,China)
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第9期464-469,共6页 中国物理B(英文版)
基金 Project supported by the National Natural Science Foundation of China(Grant Nos.61925402,61851402,and 61734003) Science and Technology Commission of Shanghai Municipality,China(Grant No.19JC1416600) National Key Research and Development Program of China(Grant No.2017YFB0405600) Shanghai Education Development Foundation and Shanghai Municipal Education Commission Shuguang Program,China(Grant No.18SG01).
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