加速器氚靶膜厚误差对BIXS方法反演的影响

Effect of Thickness Error of Accelerator Tritium Film on Inversion of BIXS Method

BIXS(β-ray induced X-ray spectrometry)方法是一种氚β衰变诱发X射线谱的氚无损分析技术,在反演过程中会受到诸多因素的影响,氚靶膜厚误差的影响不可忽略。本文基于蒙特卡罗方法程序PENELOPE模拟和实验验证研究,表明加速器氚靶膜厚误差会对BIXS方法反演有一定的影响,其中对递增分布的影响最大,对递减分布的影响最小;氚在靶膜中的深度分布的斜率越大,膜厚误差对BIXS方法反演的影响也越大。

BIXS(β-ray induced X-ray spectrometry)is a nondestructive method to analyze tritium,which can be affected by many factors in inversion process.The difference between tritium film’s thickness and inversion basic function spectrum’s thickness can’t be overlooked.By the Monte Carlo method code PENELOPE and experiment,it is found that the thickness error of accelerator tritium film has an effect for inversion of BIXS method.The thickness error makes a great impact on tritium increasing distribution,and a less impact on tritium descending distribution.The bigger the slope of tritium depth distribution in titanium film,the greater the influence of thickness error of tritium film on BIXS inversion.