摘要
针对某导航接收模块AGC电路中的厚膜片式电阻器开路失效问题,采用金相显微镜、扫描电镜和能谱分析等手段,分析失效电阻器的失效机理是因为电阻器硫化所致。通过深入研究分析电阻器硫化发生的主要原因,结合生产交付使用情况,从厚膜片式电阻器的生产制造、存储、应用、检查和评定等方面提出了几种有效预防硫化的措施,对厚膜片式电阻器防硫化应用提供参考。
Aiming at the open circuit failure of thick fi lm chip resistors in the AGC circuit of a navigation receiving module,metallographic microscope,scanning electron microscope and energy spectrum analysis are used to analyze the failure mechanism of the failed resistors caused by sulfurization.Through in-depth research and analysis of the main causes of resistor sulfurization,combined with production and delivery,several effective measures to prevent sulfurization are proposed from the aspects of manufacturing,storage,application,inspection and evaluation of thick fi lm chip resistors,which provide references for anti sulfurization application of thick fi lm chip resistors.
作者
胡小峰
陈治龙
张玉芬
HU Xiaofeng;CHEN Zhilong;ZHANG Yufen(Shaanxi Lingyun Electronics Group Co.,Ltd.,Baoji 721006,China)
出处
《电子工艺技术》
2020年第5期278-282,共5页
Electronics Process Technology
关键词
厚膜片式电阻器
硫化
失效
防硫化措施
thick fi lm chip resistor
sulfurization
failure
anti sulfurization measure