基于ATE的数控电位计非线性误差测试优化

Test Optimization of Nonlinear Error of Digitally Controlled Potentiometer Based on ATE

非线性误差是反映数控电位计精度的一项重要指标,针对ATE测试系统数字通道与模拟通道存在阻容负载及通道间耦合电容、影响数控电位计非线性误差精度测量的问题,通过在数控电位计滑动端与测试机模拟通道之间加入高输入阻抗电压跟随器,保证输出测试值不变的情况下使滑动端与后级负载形成开路,从而消除测试机负载对非线性误差的影响,实现数控电位计非线性误差的高精度测试。

The non-linear error is an important index to reflect the accuracy of the digitally controlled potentiometer.For resistance and capacitance load exists between digital channel and analog channel in ATE test system,which can affect the measurement of nonlinear error accuracy of the digitally controlled potentiometer.This paper adds the high input impedance voltage follower between the sliding end of potentiometer and the analog channel of ATE.It can keep the output constant and keep open between the sliding end and the load,which can eliminate the influence of the load of ATE on the non-linear error,and realize the high accuracy test of the non-linear error of the digitally controlled potentiometer.