摘要
针对目前单缝衍射实验存在的问题,提出了一种改进的测量方法,该方法基于面阵CCD及相关软件,实现了单缝衍射图样的采集显示,较好地完成了单缝宽度的测量,并且测量速度快,测量结果与实际结果吻合较好。
In response to the present problems in single slit diffraction experiment,an improved method on the measurement of width of single slit is proposed.The diffraction pattern of single slit diffraction and the width of single slit are successfully and quickly obtained by using area array CCD and the corresponding software.The experimental measurement results agree with the theoretical results.
作者
冯国强
余展
卢恒
杨沐晨
成志豪
吉峻平
FENG Guo-qiang;YU Zhan;LU Heng;YANG Mu-chen;CHENG Zhi-hao;JI Jun-ping(School of Physics and Electronics Information,Hubei University of Education,Wuhan 430205,China;School of Electronic Information,Sichuan University,Chengdu 610065,China)
出处
《湖北第二师范学院学报》
2020年第8期1-4,共4页
Journal of Hubei University of Education
基金
湖北第二师范学院2018年度校级教学研究项目“基于应用型创新人才培养的课堂改革和实践-以《光电技术》课程为例”(X2018071)。
关键词
单缝衍射
面阵CCD
单缝宽度
横向灰度
single slit diffraction
area array CCD
width of single slit
transverse gray-scale
