线列红外探测器盲元检测技术研究

Research on Bad Pixel Detection Technology of Line Array Infrared Detector

由材料、工艺等因素引起的盲元是衡量红外探测器光电性能的重要指标之一。以某线列扫描型碲镉汞红外探测器为研究对象,采用多种盲元检测方法分析了该探测器的盲元类型,并将分析结果作为精准确定盲元数量及位置的依据。通过对发现的盲元进行替换,得到了质量较好的图像。

The bad pixel is one of the important indexes to measure the photoelectric performance of infrared detectors which is caused by material,technology and some other factors.In this paper,a line-scanning HgCdTe infrared detector is taken as the research object,and the bad pixel types of the detector are analyzed by various bad pixel detection methods.The analysis results are taken as the basis for accurately determining the number and location of bad pixels.By replacing the bad pixels,the images with good quality are obtained.