内核页表隔离对×86架构处理器性能影响评测

Assesment of the Influence of KPTI on the Performance of CPU with×86 Architecture

针对内核页表隔离(KPTI)技术会影响×86架构处理器的性能的问题,采用不同的基准测试程序对不同的×86架构处理器进行了性能测试,提出了一种基于加权的处理器综合性能评价方法,从底层接口层及系统应用层两个层面评价了KPTI技术对×86架构处理器性能的影响,并比较了基于算术平均和基于几何平均评价方法的不同。通过计算得知,针对"熔断"漏洞的KPTI修复技术会对×86架构处理器的底层接口读写层造成不超过40%的性能损失。此外,采用几何平均的处理器综合性能评价方法相比算术平均会造成更大的性能损失。

KPTI technology will affect the performance of CPU with×86 architecture,so different benchmark test programs are used to test the performance of different CPU with×86 architecture.A weight-based comprehensive performance evaluation method for CPU is proposed,and the impact of KPTI technology on the performance of the CPU with×86 architecture is evaluated from the bottom interface layer and the system application layer,and the difference between the evaluation method based on arithmetic average and the evaluation method based on geometric average is compared.Through calculations,it is known that the KPTI repair technology for the"fuse"vulnerability will cause no more than 40%performance loss to the read and write layer of the underlying interface of the CPU with×86 architecture.In addition,the comprehensive performance evaluation method of CPU based on geometric average will cause greater performance loss than the method based on arithmetic average.