飞高对叠瓦式存储系统的性能影响分析

Analysis of Impact of Fly Height on Shingled Magnetic Recording System Performance

叠瓦式磁记录和交换耦合介质相结合是提高磁记录面密度的有效方法,飞高作为磁头设计中的主要参数之一,对系统记录性能有显著影响.本文介绍叠瓦式写磁头的结构设计,分析交换耦合介质翻转场对写入误差的影响,计算不同飞高下的写磁头磁场分布、强度和梯度.仿真结果显示飞高为10nm时,写磁头能产生的写场强度为17.51kOe,梯度为528Oe/nm,可以在提供足够大写场强度的同时获得较高的梯度,降低写入误差,提高系统性能.

The shingled magnetic recording with exchange coupled composite media is an effective method to increase the area density of magnetic recording.Fly height,as one of the important parameters in writer design,has a significant impact on system recording performance.This paper introduces the structure of shingled writer,analyzes the influence of switching filed of exchange coupled composite media on bit error rate,and calculates the magnetic field distribution,intensity and gradient of writer under different fly heights.The simulation results show that when fly height is 10nm,the intensity field is 17.51kOe,and the gradient is 528Oe/nm,which can provide adequate write field while obtaining higher gradient,lower bit error rate and improve system performance.