摘要
随着数字集成电路的不断发展,集成电路的瞬时功耗也在不断提高,对于芯片供电具有一定的挑战。本文结合一款瞬时功耗较大的芯片,介绍了去耦电容在ATE测试板上的具体应用,说明了在芯片测试过程中去耦电容的重要性。
With the rapid development of digital integrated circuits,the instantaneous power consumption of integrated circuits is also increasing,which is very challenging for chip power supply.This paper combines an IC with large instantaneous power consumption,and introduces a typically application of decoupling capacitor,explaining the importance of decoupling capacitors during IC test.
作者
陈丹熠
季晓燕
杨振学
CHEN Dan-yi;JI Xiao-yan;YANG Zhen-xue(The 54th Research Institute of CECT)
出处
《中国集成电路》
2020年第11期83-85,共3页
China lntegrated Circuit