小子样电子装备可靠性加速试验方法

Reliability Acceleration Test Method of Small Sample Electronic Equipment

针对研制项目产品数量少,可靠性鉴定试验时间长的问题,提出一种小子样可靠性加速试验方法。以传统统计试验方案为基础,选择合适的定时统计试验方案和可靠性鉴定试验剖面,对可靠性鉴定试验剖面中温度和振动应力水平进行加速,分别计算加速因子,得到加速条件下的等效试验剖面。以机载卫通天线为例,理论分析及试验验证结果表明,该方法能够明显缩短试验时间,降低试验成本。

In view of the small quantity of products and long time of reliability qualification test,a small sample reliability acceleration test method is proposed.Based on the traditional statistical test scheme,the proper timing statistical test scheme and reliability qualification test profile are selected.The temperature and vibration stress levels in the reliability qualification test profile are accelerated,the acceleration factors can be calculated respectively,and then the equivalent test profile under acceleration condition is obtained.Taking a certain airborne satellite communication antenna as an example,the theoretical analysis and test results show that the reliability acceleration test method can obviously short the test time and reduce the test cost.