基于STM32的芯片自动测试平台研究

Chip Automatic Test Platform Based on STM32

为了实现对不同型号、不同封装、不同功能的芯片进行快速的测试开发,设计一款通用型的测试平台就显得十分必要。本文即介绍了一款基于STM32设计的通用型的芯片自动测试平台,该平台采用分层结构和模块化思想,实现高效率的测试开发。

In order to achieve rapid test development for chips of different types,different packages,and different functions,it is very necessary to design a universal test platform.This article introduces a general-purpose chip automatic test platform based on STM32 design.The platform adopts hierarchical structure and modular ideas to achieve high-efficiency test development.