同步辐射聚焦光束能量带宽的检测方法

Method for Energy Bandwidth Measurement of Synchrotron Radiation Focused Beam

利用晶体高指数面的衍射消除了分析晶体带宽及聚焦光束角发散的影响,提出了聚焦条件下光束线能量带宽的检测方法。采用DuMond图解析了光束能量带宽的测量过程,并在上海光源硬X通用谱学线站搭建了检测系统。在相同能量和衍射角条件下,利用晶体的不同高指数面分别测量了聚焦光束的能量带宽;当光束能量为10 keV时,利用Si(555)测量了准直镜压弯过程中光束线能量带宽的变化,消色散配置时测得光束能量带宽最佳值为1.50 eV,与Shadow程序追迹计算的1.40 eV相比,差值控制在10%以内。结果表明,晶体的高指数面衍射可用于同步辐射聚焦光束能量带宽的高精度测量。

The influences of the analyzed crystal bandwidth and the angular divergence of focused beams were eliminated by the high-index lattice plane diffraction,and a method for energy bandwidth measurement of focused beams was proposed.In addition,a DuMond diagram was used to analyze the measurement process of energy bandwidth,and a detection system was built on the hard X-ray spectroscopy beamline at the Shanghai Synchrotron Radiation Facility.Furthermore,the different high-index lattice planes of crystals were employed for the energy bandwidth measurement of focused beams under the same energy and diffraction angle.Besides,in the context of 10 keV beam energy,the change of energy bandwidth during the bending process of the collimating mirror was measured by Si(555)and the optimal energy bandwidth measured in the non-dispersive configuration of Si(555)was 1.50 eV,with a difference of less than 10%from the calculated value(1.40 eV)by the Shadow tracker.The results demonstrate that the high-index lattice plane diffraction of crystals can be used for the high-precision energy bandwidth measurement of synchrotron radiation focused beams.